현미경/슬라이드스캐너
선진과학 기술로 보다 편한세상, 보다 풍요로운 세상을 만들어 갑니다.
MOTIC
선진과학 기술로 보다 편한세상, 보다 풍요로운 세상을 만들어 갑니다.
MOTIC
정립현미경
BA310MET
제품특징 상세사양 적용분야
재료과학의 연구을 위한 현미경
Model | BA310MET Trinocular | |||||||
Observation tube | Trinocular head Siedentopf type, 360° swiveling | |||||||
Optical system | Colour Corrected Infinity Optical System(CCIS®) | |||||||
Inclination | 30° inclined | |||||||
Trinocular light split | 100:0/20:80 | |||||||
Interpupillary distance | 48-75mm | |||||||
Diopter adjustment | On both eyepieces, +/- 5 diopter | |||||||
Eyepieces | Widefield N-WF 10X/20mm with diopter adjustment | |||||||
Nosepiece | Reversed quadruple | |||||||
Objective classification | CCIS® EC Plan Achromatic, DIN | |||||||
Objectives | 5X/0.13@(WD 20.3mm), 10X/0.25(WD 17.5mm), 20x/0.40/S(WD 8.1mm), 50X/0.55(WD 8.4mm) | |||||||
Objective mounting thread | W4/5"x1/36"(RMS standard) | |||||||
Stand type | Upright | |||||||
Stage | Mechanical stage hard coated with built-in low position rackless coaxial stage and glass plate | |||||||
Stage size | 240x140mm | |||||||
Travel range X&Y | 75x50mm(3"x2") | |||||||
Condenser | Focusable and centerable Abbe condenser N.A. 0.85 | |||||||
Diaphragm | Iris diaphragm | |||||||
Focus mechanism | Coaxial coarse and fine focusing system with tension adjustment | |||||||
Fine focus precision | 2um | |||||||
Focus stroke | 30mm | |||||||
Incident illumination | Quartz halogen 12V50W with intensity control | |||||||
Transmitted illumination | Koehler Quartz halogen 6V30W with intensity control | |||||||
Illumination interchangeability | Epi-illuminator Quartz halogen 12V50W or LED 3W, Transmitted Quartz halogen 6V30W or LED 3W | |||||||
Illumination features | External lamp house for Epi-illuminator | |||||||
Transformer | Epi-illuminator external, transmitted internal | |||||||
Power supply | 100-240V(CE) | |||||||
Accessories included | Dust cover, power cord, Allen key, blue filter | |||||||
Dimension LxWxH | 508x240x465mm | |||||||
Weight Net | 12.7kg | |||||||
Contrast techniques | ||||||||
Stand contrast technique | Brightfield | |||||||
Polarization | Optional sliders |
• 전기/전자(MEMS,웨이퍼,LCD,광전자공학,미세전자소자)
• 재료분석(야금,석면,주철,그레인사이즈)
• 부품검사
제품 소개서 다운로드