현미경/슬라이드스캐너
선진과학 기술로 보다 편한세상, 보다 풍요로운 세상을 만들어 갑니다.
MOTIC
선진과학 기술로 보다 편한세상, 보다 풍요로운 세상을 만들어 갑니다.
MOTIC
정립현미경
BA310MET
제품특징 상세사양 적용분야
재료과학의 연구을 위한 현미경
| Model | BA310MET Trinocular | |||||||
| Observation tube | Trinocular head Siedentopf type, 360° swiveling | |||||||
| Optical system | Colour Corrected Infinity Optical System(CCIS®) | |||||||
| Inclination | 30° inclined | |||||||
| Trinocular light split | 100:0/20:80 | |||||||
| Interpupillary distance | 48-75mm | |||||||
| Diopter adjustment | On both eyepieces, +/- 5 diopter | |||||||
| Eyepieces | Widefield N-WF 10X/20mm with diopter adjustment | |||||||
| Nosepiece | Reversed quadruple | |||||||
| Objective classification | CCIS® EC Plan Achromatic, DIN | |||||||
| Objectives | 5X/0.13@(WD 20.3mm), 10X/0.25(WD 17.5mm), 20x/0.40/S(WD 8.1mm), 50X/0.55(WD 8.4mm) | |||||||
| Objective mounting thread | W4/5"x1/36"(RMS standard) | |||||||
| Stand type | Upright | |||||||
| Stage | Mechanical stage hard coated with built-in low position rackless coaxial stage and glass plate | |||||||
| Stage size | 240x140mm | |||||||
| Travel range X&Y | 75x50mm(3"x2") | |||||||
| Condenser | Focusable and centerable Abbe condenser N.A. 0.85 | |||||||
| Diaphragm | Iris diaphragm | |||||||
| Focus mechanism | Coaxial coarse and fine focusing system with tension adjustment | |||||||
| Fine focus precision | 2um | |||||||
| Focus stroke | 30mm | |||||||
| Incident illumination | Quartz halogen 12V50W with intensity control | |||||||
| Transmitted illumination | Koehler Quartz halogen 6V30W with intensity control | |||||||
| Illumination interchangeability | Epi-illuminator Quartz halogen 12V50W or LED 3W, Transmitted Quartz halogen 6V30W or LED 3W | |||||||
| Illumination features | External lamp house for Epi-illuminator | |||||||
| Transformer | Epi-illuminator external, transmitted internal | |||||||
| Power supply | 100-240V(CE) | |||||||
| Accessories included | Dust cover, power cord, Allen key, blue filter | |||||||
| Dimension LxWxH | 508x240x465mm | |||||||
| Weight Net | 12.7kg | |||||||
| Contrast techniques | ||||||||
| Stand contrast technique | Brightfield | |||||||
| Polarization | Optional sliders | |||||||
• 전기/전자(MEMS,웨이퍼,LCD,광전자공학,미세전자소자)
• 재료분석(야금,석면,주철,그레인사이즈)
• 부품검사
제품 소개서 다운로드